A. V.
Klyuchnik 1, Yu. A. Pirogov 2, A. V. Solodov
1
1 Moscow
radio technical institute, Russian academy of sciences
2 M.V.
Lomonosov Moscow state university, faculty of physics
Received
January 29, 2013
Abstract.
Results of experimental and theoretical
investigations of radio action on modern integral microchips and
electronic devices are analyzed. Comparison of reversible failure levels
in microchips operation with functional failure levels of equipment allows establishing
their good coincidence.
Keywords:
reversible
failures, integral microchips, electronic equipment, functional failures.