Dynamic conductivity mechanism in amorphous nanogranulated “metal-dielectric” films in microwave frequencies
I. V. Antonets
1, L. N. Kotov
1, O. A. Kirpicheva
1, E. A. Golubev 2, Yu. E. Kalinin 3, A. V. Sitnikov
3, V. G. Shavrov 4, V. I. Shcheglov 4
1Syktyvkar State University, Syktyvkar, Russia
2 Geology Institute Komy SC UrD RAS, Syktyvkar, Russia
3 Voronezh State Technical University, Voronezh, Russia
4 Kotel’nikov Institute of Radio Engineering and Electronics
of RAS, Moscow,
The paper is received on April 22, 2014
Abstract. In experiments the static
conductivity on direct current and electromagnetic microwave reflectivity from
thin nanogranulated amorphous composite metal-dielectric films were
investigated. It was found the exceeding of dynamic conductivity over static on
two-four orders. For the explanation of these experimental results the model of
intergranular (intercluster) currents is proposed. The microwave reflection
coefficient from films in connection with theirs granular character is found.
It is proposed the mechanism of individual granular fields compensation which
leads to sharp dependence of reflection coefficient from film thickness.
Key words: thin films, nanocomposit
metal-dielectric, electromagnetic wave reflection.