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Dynamic conductivity mechanism in amorphous nanogranulated “metal-dielectric” films in microwave frequencies

I. V. Antonets 1, L. N. Kotov 1, O. A. Kirpicheva 1, E. A. Golubev 2, Yu. E. Kalinin 3, A. V. Sitnikov 3, V. G. Shavrov 4, V. I. Shcheglov 4

1Syktyvkar State University, Syktyvkar, Russia

2 Geology Institute Komy SC UrD RAS, Syktyvkar, Russia
3 Voronezh State Technical University, Voronezh, Russia

4 Kotel’nikov Institute of Radio Engineering and Electronics of RAS, Moscow, Russia


The paper is received on April 22, 2014


Abstract. In experiments the static conductivity on direct current and electromagnetic microwave reflectivity from thin nanogranulated amorphous composite metal-dielectric films were investigated. It was found the exceeding of dynamic conductivity over static on two-four orders. For the explanation of these experimental results the model of intergranular (intercluster) currents is proposed. The microwave reflection coefficient from films in connection with theirs granular character is found. It is proposed the mechanism of individual granular fields compensation which leads to sharp dependence of reflection coefficient from film thickness.

Key words:  thin films, nanocomposit metal-dielectric, electromagnetic wave reflection.