UDC 539.32

Size effect in dependence of the elastic characteristics of thin copper films on their thickness

 

K. M. Tsysar ¹, V.S. Zelenskiy ¹, V.A. Vdovin ² , V.G. Andreev ¹

 ¹ M.V. Lomonosov Moscow State University, Faculty of Physics, Leninskie Gory Bldg. 1-2, Moscow 119991, Russia

 ² Kotelnikov Institute of Radioengineering and Electronics of the Russian Academy of Sciences, Mokhovaya 11-7, Moscow 125009, Russia

 

The paper is received on November 29, 2017

 

Abstract. Longitudinal elastic deformations of free copper films and thin copper films formed on a substrate surface are studied by the methods of classical molecular dynamics. Dependence of the elastic properties of copper films on the thickness and method of film formation was found. The critical values of the longitudinal stresses on the rapture and the limiting values of the elastic deformations at which irreversible defects in the atomic structure appear in the film are determined. The transitions from the elastic region to the plasticity region of films as a function of thickness were determined for both types of films. The critical stresses are calculated for the destruction of the surface of the film. The data obtained can be used for further investigation of the properties of surface nanoscale structures, studying the effect of deformations of films on their quantum absorbing and conducting properties, as well as the properties of nano-dimensional circuits and devices formed on their surface.

Keywords: copper nanofilms,  molecular dynamics, film elasticity, Young's modulus.

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For citation:
K. M. Tsysar, V. S. Zelenskiy, V. A. Vdovin, V. G. Andreev. Size effect in dependence of the elastic characteristics of thin copper films on their thickness. Zhurnal Radioelektroniki - Journal of Radio Electronics. 2017. No. 12. Available at http://jre.cplire.ru/jre/dec17/7/text.pdf.