Dielectric parameters of the modern
low-loss ceramics in the microwave, millimeter, and submillimeter ranges
Vladimir V. Parshin1, Evgeny A.
Serov1, Evgeny E. Chigryai2, Boris M. Garin2, Roman N. Denisiuk2, Dmitry S.
Kalyonov2, Mingqing
Ding3, Lili Li3, Yanping Lu3, Yanling Yang3, Youhuan Liang3, Jinjun Feng3, and Polina V. Ershova4
1 Institute of Applied
Physics of Russian Academy of Sciences,
603950, Nizhny Novgorod, Russia
2 Fryazino
Branch of Kotelnikov Institute of Radioengineering and Electronics of Russian
Academy of Sciences, Vvedensky Sq.1, Fryazino Moscow region 141190, Russia
3 Vacuum Electronics
National Lab, Beijing Vacuum Electronics Research Institute, 100015, Beijing,
China
4 Public Corporation “Magneton”,
194223, St.-Petersburg, Russia
The paper is received on February 15, 2018
Abstract. The dielectric parameters
in a very wide frequency range 10–350 GHz in the modern low-loss ceramics, the aluminum
nitride AlN
and aluminum oxide Al2O3,
fabricated in China and Russia, are investigated. The measurements of the
refractive index and dielectric loss tangent were conducted using different techniques
and measurement setups. For the measurement of dielectric loss in the microwave range, at
frequency of 9.4 GHz, the closed
metal cavity resonator was used. For the measurements of refractive index in the
millimeter (MM) and submillimeter (SubMM) ranges, at the frequencies of 60–350
GHz, both open resonators and scalar network analyzers were used. For the
measurements of dielectric loss in the MM and SubMM ranges different open
resonators were used.
The refractive
index and dielectric loss were measured at f=70–350 GHz. in three
Chinese samples of ceramic AlN and two samples of ceramic Al2O3. In all samples the losses
are very low: tand <10-3. Also the dielectric loss
was measured in newest Russian sample of ceramic Al2O3, fabricated
in the PC
"Magneton" (of the brand “VK100M”). The loss in it is the lowest loss observed among
ceramics Al2O3. Moreover,
this loss is only slightly higher, that in the corresponding single crystal (sapphire).
The nature of
observed losses is considered. The loss frequency dependencies in the MM and SubMM ranges in
all ceramics Al2O3 studied can be well
described by the linear approximation. Such dependence corresponds to the mechanism of
so-called one-phonon lattice loss induced by the crystal lattice disorder.
Key words: dielectric loss,
refractive index, low loss ceramics, microwave, millimeter, and submillimeter ranges, open resonators.
References
1. Firsenkov
A.I., Kanivets A.Yu., Kasatkina T.S., Ershova O.M., Ivanova L.P., Ershova P.V.,
Microwave dielectric materials fabricated in the PC “Magneton”, Sbornic
statei IV Vserossiiskoi Konferentsii “Elektronica i Mikroelektronika SVCh” [Collection
of papers of the Fourth All-Russian Conf. "Microwave Electronics and
Microelectronics"] Saint-Petersburg,
publishing of the Saint-Petersburg
State Electrical-engineering
University “LETI”, 2015, Vol. 2, pp. 55–59. (In russian)
2. Parshin
V.V., Serov E.A., Ershova P.V., The
study of dielectric properties of modern ceramic materials in the millimeter
range, Sbornic statei Shestoi Vserossiiskoi Konferentsii “Elektronica
i Mikroelektronika SVCh” [Collection of papers of the Sixth All-Russian Conf. "Microwave
Electronics and Microelectronics"] Saint-Petersburg, publishing of the Saint-Petersburg State Electrical-engineering University “LETI”, 2017, pp.
418–422.(In Russian)
3. Parshin V.V., Serov
E.A., Chigryai E.E., Garin B.M., Denisyuk R.N., Kalyonov D.S., Li L., Feng J.,
Ershova P.V. Dielectric parameters of newest low absorption ceramics in
microwave and millimeter ranges. V Vserossiiskaya mikrovolnovaya
Konferntsiya, Doklady [Proc. of Fifth All-Russian Microwave Conference],
Moscow, Kotel’nikov IRE of RAS, November 29 – December 1, 2017, pp. 226–230. Publ.:
Kotel’nikov IRE of RAS, 2017. (In Russian)
4. Dryagin Yu.A., Parshin
V.V., A method for determination of dielectric permittivity and loss tangent. The
Copyright Certificate No. 1539681, Bulletin No. 40, The USSR State Committee for inventions and
discoveries, 1990, January 30. (In Russian)
5. Dryagin
Yu.A., Parshin V.V. A method to measure dielectric parameters in 5÷0,5 mm
wavelength band. International Journal of Infrared and Millimeter Waves,
1992, Vol. 13, No.7, pp.1023–1032.
6. S.N. Vlasov, E.V. Koposova, A.B.
Mazur and V.V. Parshin. On permittivity measurement by a resonance method. Radiophysics
and Quantum Electronics, 1996, Vol. 39, No. 5, pp. 410-415.
7. Parshin V.V., Tretyakov M.Yu.,
Koshelev M.A., Serov E.A. Instrumental complex and the results of precise
measurements of MM and SubMM wave propagation in condensed media and
atmosphere. Radiophysics and Quantum Electronics, 2012, Vol. 52,
No. 8, pp. 525-535. DOI:10.1007/s11141-010-9169-0
8. Parshin
V.V., Tretyakov M.Yu., Koshelev M.A., Serov E.A., Modern resonator spectroscopy
at submillimeter wavelengths. IEEE Sensors Journal, 2013, Vol. 13, No 1,
pp. 18–23.
9. E.E. Chigryai,
B.M. Garin, R. N. Denisyuk, D. S. Kalenov, I. P. Nikitin. Ultralow absorption in
silicon carbide in the millimeter wave range”, Zhurnal Radioelektroniki
- Journal of Radio Electronics, 2016, No. 11. Available at
http://jre.cplire.ru/jre/nov16/6/text.pdf.
10. B.M Garin, "One-phonon dielectric c losses by
excitation of sound". Sov. Phys. Solid State 32 (11) (1990)
1917–1920.
11. B.M. Garin, "Disorder-induced one-phonon absorption
of millimeter and submillimeter waves", SPIE Proc. Vol. 2211b, USA,
1994, pp. 606–614.
12. A.R. Hippel, Dielectrics and Waves, N.-Y., John Willey
& Sons, 1954.