Transparent dielectric media reflection index measurement method
J. Kh.
Nurligareev 1,2,
A. S. Belanov
1, M. V.
Fadin 1,2
1 The Moscow State Academy of
Instrument Engineering and Computer Science
2 Laser Materials and Technology
Research Center, General Physics Institute, Russian Academy of Science
The paper is received on June 30, 2014
Abstract. The method of refractive
index of transparent dielectric media measuring is proposed based on rigorous
analytic description of optical radiation reflection on the plane boundary of homogeneous
dielectric and one-dimensional photonic crystal (multi-layer film structure).
Key words: one-dimensional photonic
crystal, multi-layer film structure, Floquet-Bloch wave.