"JOURNAL OF RADIO ELECTRONICS" (Zhurnal Radioelektroniki)  ISSN 1684-1719, N 3, 2017

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Bolometers based on the structure superconductor-insulator-normal metal with normal metal suspended bridges

 

R. Yusupov1, 2, M. Fominsky1, V. Edelman3, M. Tarasov1,3,4, A. Yurgens4

1 V.Kote'lnikov Institute of Radio Engineering and Electronics  of RAS, Mokhovaya 11-7, Moscow 125009, Russia.

2 Moscow Institute of Physics and Technology (State University), 141701, Moscow region, Dolgoprudnyy, Institutskii lane, 9.

2 P.Kapitza Institute for Physical Problems of RAS, Kosygina st., 2, Moscow 117334, Russia

4 Chalmers University of Technology, SE-41296 Gothenburg, Sweden

 

The paper is received on February 20, 2017, after correction - on March 7, 2017

 

Abstract. New type of bolometer with a suspended normal-metal thin film bridges between superconducting aluminum electrodes with tunnel barriers forming a SINIS structure was studied.  The lack of direct contact of a normal metal (absorber) and the substrate reduce heat loss to the substrate.  Studied bolometers were integrated in dual slot and log-periodic antenna in the terahertz frequency range.  The aluminum was used as the superconductor, various options, such as palladium, hafnium and copper studied as a normal metal. Samples were measured in a cryostat at temperatures 75-480 mK. Electric response was more than 109 B/W by heated direct current through an additional pair of contacts in a special structure.  Optical response was measured at a frequency of 350 GHz at a temperature of 100 mK, it was more than 2*108 V/W.  The current response at the same power of radiation was 1.1*104 A/W, the quantum efficiency was up to 15 electrons at the quantum.

Keywords: NIS junction, bolometer, manufacturing suspended structures, optical response, black body.

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For citation:

R.Yusupov, M.Fominsky, V.Edelman, M.Tarasov, A.Yurgens. Bolometers based on the structure superconductor-insulator-normal metal with normal metal suspended bridges. Zhurnal Radioelektroniki - Journal of Radio Electronics, 2017, No. 3. Available at http://jre.cplire.ru/jre/mar17/1/text.pdf. (In Russian)