Measurement of dielectric loss at millimeter range in the low loss materials with arbitrary ratio of wavelength and sample thickness

 

E. E. Chigryai, B. M. Garin, R. N. Denisyuk

Fryazino Branch of Kotelnikov Institute of Radioengineering and Electronics of Russian Academy of Sciences, Vvedensky Sq.1, Fryazino Moscow region 141190, Russia

 

The paper was received on October 3, 2018

 

Abstract. For the first time the measurement technique is developed for dielectric loss in the low loss materials at the long-wave part of the millimeter range of electromagnetic waves on the basis of compact open semi-symmetric confocal resonator for the samples with arbitrary ratio of the sample thickness and wavelength in the dielectric material. The loss in the aluminum oxide ceramics (Al₂O₃) of the brand VK-99 was measured at room temperature at the frequency 69.4 GHz: tanδ = 3.1×10^-4. This value is close to the corresponding value in the aluminium oxide ceramics Al₂O₃ of the Russian production of the brand VK100M, and it is lower than in the corresponding ceramics of the Chinese production [5]. In addition, this value is close to the loss in the single crystal of Al₂O₃ (sapphire). This indicates a very high quality of the modern Russian ceramics of aluminum oxide.

Key words: open resonator, millimeter range of electromagnetic waves, dielectric loss, low loss materials.

 

For citation:

E. E. Chigryai, B. M. Garin, R. N. Denisyuk. Measurement of dielectric loss at millimeter range in the low loss materials with arbitrary ratio of wavelength and sample thickness. Zhurnal Radioelektroniki - Journal of Radio Electronics. 2018. No. 10. Available at http://jre.cplire.ru/jre/oct18/10/text.pdf

DOI  10.30898/1684-1719.2018.10.10