Journal of Radio Electronics. eISSN 1684-1719. 2025. ¹10
Full text in Russian (pdf)
DOI: https://doi.org/10.30898/1684-1719.2025.10.2
INVESTIGATION OF THE APPLICABILITY
OF ELECTRICAL CONDUCTIVITY MODELS
TO THE ANALYSIS OF LOW-FREQUENCY NOISE
V.A. Sokurenko, Yu.V. Sakharov, P.E. Troyan
Tomsk State University of Control Systems and Radioelectronics
634050, Russia, Tomsk, Lenin Avenue, 40
The paper was received September 1, 2025.
Abstract. Low-frequency noise is a fundamental phenomenon in electronic components and can serve as a highly sensitive diagnostic parameter for predicting device degradation. Carbon-based thick-film resistors exhibit pronounced noise characteristics, making them promising objects for studying charge transport mechanisms. The aim of this work is to correlate the current-voltage characteristics (I-V curves) and the low-frequency noise I-V characteristics to identify charge transport mechanisms. Carbon-containing thick-film resistors with a polymer binder were investigated. A comparison of the I-V curves and the I-V characteristics of low-frequency current noise was carried out in the frequency range of 0,5-10 Hz at temperatures of 25, 45, and 65 °C. The experimental data were analyzed in coordinate systems corresponding to the Schottky, Poole-Frenkel, and tunneling models (direct and thermally assisted tunneling, trap-assisted emission, Fowler-Nordheim tunneling). For the Schottky and Poole-Frenkel mechanisms, a high correlation between the I-V and noise I-V characteristics was observed, with an approximation reliability of R² > 0.98. In the case of tunneling models, deviations from linearity were observed in the low-voltage region, while at voltages above 2 V the dependencies became more linear, confirming the dominance of tunneling processes. It is shown that the analysis of noise characteristics can serve as a reliable tool for verifying electrical conduction mechanisms and can be applied to diagnose structural and energetic parameters of composite resistive materials.
Key words: low-frequency noise, I-V characteristics, Schottky mechanism, Poole-Frenkel mechanism, tunneling, barrier, verification.
Financing: This work was carried out within the framework of the TUSUR Development Program for 2025-2036 of the Strategic Academic Leadership Program «Priority 2030»”
Corresponding author: Sokurenko Vyacheslav Arturovich, sokurenko.sl.08@mail.ru
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For citation:
Sokurenko V.A., Sakharov Yu.V., Troyan P.E. Investigation of the applicability of electrical conductivity models to the analysis of low-frequency noise. // Journal of Radio Electronics. – 2025. – ¹. 10. https://doi.org/10.30898/1684-1719.2025.10.2 (In Russian)