Zhurnal Radioelektroniki - Journal of Radio Electronics. eISSN 1684-1719. 2023. №9
Contents

Full text in Russian (pdf)

DOI: https://doi.org/10.30898/1684-1719.2023.9.3

ISSUE OF ASSESSING THE RELIABILITY

OF SUPERLUMINESCENT DIODES

F.M. Makoveev

ANTARES

410012, Russia, Saratov

Radishcheva str., 27

The paper was received June, 16, 2023

Abstract. A superluminescent diode (SLED or SLD) are used in low coherence tomography and in fiber-optic gyroscopes, where sources with a short coherence length and relatively high radiation power are required. SLED are, as a rule, the least reliable, and at the same time, extremely important for ensuring operability device. The article discusses the issue of resource reliability of the SLED to analyze the possibility of improving the accuracy of devices based on them during long-term operation. The work is a brief overview of achievements in the field of resource reliability analysis of quantum optical semiconductor devices, obtaining a general representation of the reliability of superluminescent radiation sources, changes in their parameters as a result of degradation, consideration of ways to solve problems associated with their spectral degradation.

Key words: superluminescent diode, reliability, lifetime tests, 1/f noise, Arrhenius equation.

Corresponding author: Makoveev Fedor Michailovich, makoveev33@gmail.com

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For citation:

Makoveev F.M. Issue of assessing the reliability of superluminescent diodes. Zhurnal radioelektroniki [Journal of Radio Electronics] [online]. 2023. №. 9. https://doi.org/10.30898/1684-1719.2023.9.3 (In Russian)