"JOURNAL OF RADIOELECTRONICS" N 8, 2000 |
POTENTIAL RADAR THICKNESS MEASUREMENTS ACCURACY OF LAYERED ENVIRONMENTS
Albert G. Oganesian, Igor B.
Tchaikovsky
Lvov Polytechnic University
Received Aug 5, 2000
The probable estimations of potential accuracy of layered environments thickness measurement are considered and the comparative analysis with results of in-flight tests imitating of ground penetrating radars is given.
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