Statistics of microwave diodes damage by RF pulses

 

A. V. Klyuchnik¹, Yu. A. Pirogov², A. V. Solodov¹
 

¹Moscow Radio Technical Institute of Russian Academy of Sciences

²Lomonosov Moscow State University, Centre of Magnetic Tomography and Spectroscopy

Received November 29, 2010

 

Abstract. The process of microwave diodes damages accumulation at influence of a sequence of RF pulses is considered. The statistical analysis of damage probability of microwave diodes is carried out.

 

Keywords: model, damages accumulation, microwave diodes, RF pulse.