"JOURNAL OF RADIO ELECTRONICS"  N 6, 2013

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Damages of integrated microcircuits in radio fields

Yu. A. Pirogov 1, A. V. Solodov 2

1 M.V. Lomonosov Moscow State University, Faculty of Physics

Moscow Radio Technical Institute, Russian Academy of Sciences

 

Received June 21, 2013

 

Abstract. The possible mechanisms causing degradation and catastrophic failures of microcircuits in electromagnetic fields of powerful RF pulses are considered. Results of experimental researches and the damage mechanism models are analyzed for the modern integral microcircuits under influence of RF pulses.

Keywords: degradation, damage, failure, integral microcircuits, RF pulses.