"JOURNAL OF RADIO ELECTRONICS"  N 9, 2015

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Local measurement of dielectric properties of materials by terahertz Josephson spectroscopy

A.    Snezhko1,2, V. Pavlovskiy1, V. Gubankov1, V. Pokalyakin1

1Kotelnikov Institute of Radio-engineering and Electronics of RAS

2Moscow Institute of Physics and Technology

 

The paper is received on September 15, 2015

 

Abstract. In the paper a method based on Josephson spectroscopy for local measurement of real dielectric permittivity of different materials with low losses is demonstrated. Dielectric permittivities of r-cut sapphire εsapphire = 9.6 at f=155,2 GHz and (001) NdGaO3 εNGO = 23 at f=106,4 GHz are obtained.

Key words: terahertz electronics, superconductivity, Josephson junction.