N 2 - ôåâðàëü 2008 ã.
ÐÀÄÈÎÒÅÕÍÈÊÀ
Àëãîðèòì ïîëó÷åíèÿ êîðîòêèõ ñôåðè÷åñêèõ êîäîâ íà îñíîâå òðîåê Øòåéíåðà.
À.Ñ. ×åðíûøåâ
Àííîòàöèÿ. Òåêñò: html, pdf (137 kB)
ÔÈÇÈ×ÅÑÊÈÅ ÏÐÎÁËÅÌÛ ÝËÅÊÒÐÎÍÈÊÈ
ÒÂÅÐÄÎÒÅËÜÍÀß ÝËÅÊÒÐÎÍÈÊÀ
Determination of technological parameters of drift transistors according to specified operational characteristics.
A.N. Frolov, Ê.A. Frolov, S.V. Shutov
Àííîòàöèÿ. Òåêñò: html, pdf (67 kB)
ÝËÅÊÒÐÎÄÈÍÀÌÈÊÀ
Àïïðîêñèìàöèîííûé ñèíòåç àíòåííîé ðåøåòêè àâòîêîìïåíñàòîðà ïîìåõ.
Â.Í. Êîëåñíèêîâ, Ñ.Å. Ìèùåíêî, Â.Â. Øàöêèé
Àííîòàöèÿ. Òåêñò: html, pdf (530 kB)
ÁÈÎÌÅÄÈÖÈÍÑÊÀß ÐÀÄÈÎÝËÅÊÒÐÎÍÈÊÀ
ÌÀÒÅÌÀÒÈ×ÅÑÊÈÅ ÌÅÒÎÄÛ Â ÇÀÄÀ×ÀÕ ÐÀÄÈÎÝËÅÊÒÐÎÍÈÊÈ
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ÑÌÅÆÍÛÅ ÏÐÎÁËÅÌÛ ÐÀÄÈÎÝËÅÊÒÐÎÍÈÊÈ
Influence of light scattering by 3D-irregularities on the characteristics of the integrated optical devices using for optical signal processing.
A.A. Egorov
ÑÒÓÄÅÍ×ÅÑÊÈÅ ÏÓÁËÈÊÀÖÈÈ
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- ñòàòüÿ íà ðóññêîì ÿçûêå, - ñòàòüÿ íà àíãëèéñêîì ÿçûêå.
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