"JOURNAL OF RADIO ELECTRONICS"  N 12, 2010

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Statistics of microwave diodes damage by RF pulses

 

A. V. Klyuchnik1, Yu. A. Pirogov2, A. V. Solodov1
 

1Moscow Radio Technical Institute of Russian Academy of Sciences

2Lomonosov Moscow State University, Centre of Magnetic Tomography and Spectroscopy

Received November 29, 2010

 

Abstract. The process of microwave diodes damages accumulation at influence of a sequence of RF pulses is considered. The statistical analysis of damage probability of microwave diodes is carried out.

 

Keywords: model, damages accumulation, microwave diodes, RF pulse.