Statistics of microwave diodes
damage by RF pulses
Klyuchnik1, Yu. A. Pirogov2, A. V. Solodov1
1Moscow Radio Technical Institute of Russian Academy
2Lomonosov Moscow State University, Centre
of Magnetic Tomography and Spectroscopy
Received November 29, 2010
The process of
microwave diodes damages accumulation at influence of a sequence of RF pulses is
considered. The statistical analysis of damage probability of microwave diodes
is carried out.
model, damages accumulation,
microwave diodes, RF pulse.