Assessment of ionizing radiation impact on electronic components on the base of testing of limited samples

 

M.M. Venediktov1,

E.S. Obolenskaya2,

V.K. Kiselev1,

S.V. Obolensky2

 

 ¹ Sedakov Research Institute of Measuring Systems, Tropinina 47, Nizhny Novgorod 603137, Russia

² Lobachevsky State University of  Nizhny Novgorod, Gagarina 23, Nizhny Novgorod 603022, Russia

 

The paper is received on December 15, 2016

 

Abstract. The resistance of electronic components to the cart-ionizing radiation (IR), the results of tests of limited electronic components of the sample (ECB) were investigated. Particular attention is drawn to the noise factor - the main criterial option of low-noise amplifiers. The problem is that at frequencies above 12 GHz noise figure cannot be measured on the signal lines of up to 25 meters long, used in testing semiconductor ECB on modelling devices - pulsed nuclear reactors. Based on physical and topological modelling and comparison with experimental data we suggest a simple analytical approach to the settlement and the experimental determination of the noise factor during and after radiation exposure. This allows to use the specified criterial parameter along with other parameters when testing low-noise amplifiers.

Key words: resistance of electronic components, ionizing radiation, noise figure, low noise amplifiers, pulsed nuclear reactor.

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Reference to this paper:

Assessment of impact of ionizing radiation on electronic components on the base of testing of limited samples. M.M.Venediktov, E.S. Obolenskaya, V.K. Kiselev, S.V. Obolensky. Zhurnal Radioelektroniki - Journal of Radio Electronics, 2017, No. 1. Available at http://jre.cplire.ru/jre/jan17/2/text.pdf. (In Russian)