Damages of integrated
microcircuits in radio fields
Yu. A. Pirogov 1, A. V. Solodov 2
1 M.V.
Lomonosov Moscow State University, Faculty of Physics
2 Moscow
Radio Technical Institute, Russian Academy of Sciences
Received
June 21, 2013
Abstract.
The possible mechanisms
causing degradation and catastrophic failures of microcircuits in
electromagnetic fields of powerful RF pulses are considered. Results of
experimental researches and the damage mechanism models are analyzed for the
modern integral microcircuits under influence of RF pulses.
Keywords: degradation,
damage, failure, integral microcircuits, RF pulses.