"JOURNAL OF RADIO ELECTRONICS" (Zhurnal Radioelektroniki ISSN 1684-1719, N 11, 2019

contents of issue      DOI  10.30898/1684-1719.2019.11.3     full text in Russian (pdf)  

UDC 621.382.8.017.7

ADAPTIVE ALGORITHMS FOR MEASURING LOW-FREQUENCY NOISE PARAMETERS OF SEMICONDUCTOR DEVICES

 

V. A. Sergeev 1,2, S. E. Rezchikoff 2,3

 

1 Ulyanovsk branch of Kotelnikov Institute of Radio-Engineering and Electronics of Russian Academy of Science, Goncharova 48/2, Ulyanovsk 432071, Russia

2 Ulyanovsk State Technical University, Severny Venets 32, Ulyanovsk 432027, Russia

3 JSC Ulyanovsk Mechanical Plant, 432008, Moskovskoe shosse 94, Ulyanovsk 432008, Russia

The paper is received on October 21, 2019

Abstract. Conditions of measurement of power spectral density (PSD) of low-frequency (LF) noise with spectrum of the form G (f) = A/fγ of semiconductor devices (SD) by direct estimation method are investigated. It is shown that optimal band of integrating filter, at which total error of PSD measurement is minimal, is a function of index γ of spectrum shape, which value is a priori unknown. In the case, when it is possible to neglect thermal and shot components of noise of SD in comparison with LF noise level in a given frequency range, and γ can be considered constant, for finding the value of γ it is sufficient to measure PSD at two frequencies. Possibilities of reduction of error of PSD measurement at the specified frequency and determination of γ in the specified frequency range are analyzed by application of adaptive algorithms at the specified measurement time. Estimates of the gain in accuracy of measurement of these parameters are given using an algorithm, that includes the stage of preliminary estimation of the value of γ, the determination of the optimal filter band value from the obtained estimate, the measurement of PSD at a given frequency and the subsequent refinement of the value of γ. Organization of measurement of noise parameters of SD in conditions of mass production is discussed in order to reduce measurement error with adaptive or cognitive adjustment of parameters of measuring system based on results of evaluation of sample averages on training sample.

Keywords: low frequency noise, power spectral density, spectrum shape index, measurement, error, optimal conditions, adaptive algorithm.

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For citation:

Sergeev V.A., Rezchikoff S.E. Adaptive algorithms for measuring low-frequency noise parameters of semiconductor devices. Zhurnal Radioelektroniki - Journal of Radio Electronics. 2019. No. 11. Available at http://jre.cplire.ru/jre/nov19/3/text.pdf

DOI  10.30898/1684-1719.2019.11.3