UDC 621.382.8.017.7
ADAPTIVE
ALGORITHMS FOR MEASURING LOW-FREQUENCY NOISE
PARAMETERS OF SEMICONDUCTOR DEVICES
V.
A. Sergeev 1,2, S. E. Rezchikoff 2,3
1 Ulyanovsk branch of Kotelnikov Institute of
Radio-Engineering and Electronics of Russian Academy of Science, Goncharova 48/2, Ulyanovsk 432071, Russia
2 Ulyanovsk State Technical
University, Severny Venets 32, Ulyanovsk
432027, Russia
3 JSC «Ulyanovsk Mechanical Plant»,
432008, Moskovskoe shosse 94, Ulyanovsk 432008, Russia
The
paper is received on October 21, 2019
Abstract. Conditions
of measurement of power spectral density (PSD) of low-frequency (LF) noise with
spectrum of the form G (f) = A/fγ of
semiconductor devices (SD) by direct estimation method are investigated. It is
shown that optimal band of integrating filter, at which total error of PSD
measurement is minimal, is a function of index γ of spectrum
shape, which value is a priori unknown. In the case, when it is possible to
neglect thermal and shot components of noise of SD in comparison with LF noise
level in a given frequency range, and γ can be considered constant,
for finding the value of γ it is sufficient
to measure PSD at two frequencies. Possibilities of reduction of error of PSD
measurement at the specified frequency and determination of γ in
the specified frequency range are analyzed by application of adaptive
algorithms at the specified measurement time. Estimates of the gain in accuracy
of measurement of these parameters are given using an algorithm, that includes the
stage of preliminary estimation of the value of γ, the
determination of the optimal filter band value from the obtained estimate, the measurement
of PSD at a given frequency and the subsequent refinement of the value of γ. Organization
of measurement of noise parameters of SD in conditions of mass production is
discussed in order to reduce measurement error with adaptive or cognitive
adjustment of parameters of measuring system based on results of evaluation of
sample averages on training sample.
Keywords:
low frequency noise, power spectral density, spectrum
shape index, measurement, error, optimal conditions, adaptive algorithm.
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For citation:
Sergeev V.A.,
Rezchikoff S.E. Adaptive algorithms for measuring low-frequency noise
parameters of semiconductor devices. Zhurnal Radioelektroniki - Journal of
Radio Electronics. 2019. No. 11. Available
at http://jre.cplire.ru/jre/nov19/3/text.pdf
DOI 10.30898/1684-1719.2019.11.3