Zhurnal Radioelektroniki - Journal of Radio Electronics. eISSN 1684-1719. 2020. No. 11

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DOI  https://doi.org/10.30898/1684-1719.2020.11.13

UDC 621.382.049.77


Influence of powerful electromagnetic pulses on the operation of typical integrated microcontrollers


V. A. Vdovin 1, A. A. Geraskin 2, P. A. Gorbokonenko 2, S. A. Sapetskiy 1, V. A. Cherepenin 1

1 Kotelnikov Institute of Radioengineering and Electronics of the Russian Academy of Sciences, Mokhovaya 11-7, Moscow 125009, Russia

2 MIREA − Russian Technological University, Vernadsky prosp., 78, Moscow 119454, Russia


The paper is received on November 20, 2020 


Abstract. The effects arising in an integrated microchip (IC) of a microcontroller (MC) performing test logic operations under the action of powerful electrical impulses are investigated. The IC MC STM8S003 was chosen as a typical microcontroller. The exposure was carried out by electric pulses with an electric field strength of up to 20 kV/cm and a duration of 6 ns. It is shown that impulse influences can lead to logical failures when performing IC MC logical operations, the effectiveness of the influence depends not only on the parameters of the electromagnetic pulse, but also on the specific operation performed during which it occurred. The repetition rate of electromagnetic pulses up to 1 kHz does not significantly affect the type of failures of the IC MC. The supply voltage of the IC MC affects its stability; to create a failure, an increase in the amplitude of the electromagnetic pulse is required with an increase in the supply voltage. Passive components of a printed circuit board are more susceptible to electromagnetic influences than IC MC.

Keywords: exposure to powerful electromagnetic pulses, nanosecond pulses, microchips, microcontroller, reversible failures.


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For citation:

Vdovin V.A., Geraskin A.A., Gorbokonenko P.A., Sapetskiy S.A., Cherepenin V.A. Influence of powerful electromagnetic pulses on the operation of typical integrated microcontrollers. Zhurnal Radioelektroniki - Journal of Radio Electronics. 2020. No.11. https://doi.org/10.30898/1684-1719.2020.11.13  (In Russian)