Abstract.
To assess the durability
of the LED to the effects of a periodic sequence of microwave pulses, a
mathematical thermoelectric model was developed. The mathematical description of the
model is the joint solution of time-dependent equations of electric and heat
conductivity with temperature-dependent thermo-physical and electrical
characteristics of the elements of the device structure and bulk density of thermal
power. Three LED heating phases corresponding to sequential regimes of work and
different external conditions were considered: the LED structure heat in the
operation mode until the temperature reaches a steady value; thermal heating of
the structure by means of incoming operating electric power of the device and
power of electromagnetic radiation; and then melting of its structure. Calculation
studies were carried out for AlGaAs/GaAs and InGaN/GaN structures of high-power
LEDs on 6H-SiC substrate. Analysis of the results of computational studies showed: 1)
the magnitude of the pulse duration and the repetition period have a significant
effect on the process of heat accumulation in the structure of the LED and the
value of its maximum temperature; 2) an increase in the pulse repetition rate
and pulse duration may result in the accumulation of more heat in the structure
and in the reduction of the critical level of the power density of the EMP,
leading either to a deterioration in the quality of the device's operation or
to the destruction of its structure; 3) for a given pulse duration, required
for damage to the structure of the LED, the energy of the EMR is required the
less, the larger the value of the duty cycle of the pulse train.
Key words:
pulse of microwave
radiation, radiation power, critical temperature, pulse duration, pulse
frequency.
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