"JOURNAL OF RADIO ELECTRONICS" (Zhurnal Radioelektroniki ISSN 1684-1719, N 10, 2017

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Evaluation of LED durability to the effect of a periodic sequence of microwave pulses in the framework of the thermoelectric model

A. M. Hodakov, V. A. Sergeev

Ulyanovsk Branch of Kotelínikov Institute of Radio-Engineering and Electronics of RAS, Goncharova 48/2, Ulyanovsk 432071, Russia

 

The paper is received on October 13, 2017

 

Abstract. To assess the durability of the LED to the effects of a periodic sequence of microwave pulses, a mathematical thermoelectric model was developed. The mathematical description of the model is the joint solution of time-dependent equations of electric and heat conductivity with temperature-dependent thermo-physical and electrical characteristics of the elements of the device structure and bulk density of thermal power. Three LED heating phases corresponding to sequential regimes of work and different external conditions were considered: the LED structure heat in the operation mode until the temperature reaches a steady value; thermal heating of the structure by means of incoming operating electric power of the device and power of electromagnetic radiation; and then melting of its structure. Calculation studies were carried out for AlGaAs/GaAs and InGaN/GaN structures of high-power LEDs on 6H-SiC substrate. Analysis of the results of computational studies showed: 1) the magnitude of the pulse duration and the repetition period have a significant effect on the process of heat accumulation in the structure of the LED and the value of its maximum temperature; 2) an increase in the pulse repetition rate and pulse duration may result in the accumulation of more heat in the structure and in the reduction of the critical level of the power density of the EMP, leading either to a deterioration in the quality of the device's operation or to the destruction of its structure; 3) for a given pulse duration, required for damage to the structure of the LED, the energy of the EMR is required the less, the larger the value of the duty cycle of the pulse train.

Key words: pulse of microwave radiation, radiation power, critical temperature, pulse duration, pulse frequency.

References

1. GOST R 51317.4.4-99. Sovmestimost tekhnicheskikh sredstv elektromagnitnaya. Ustoychovost k nanosekundnym impulsnym pomekham. Trebovaniya i metody ispytaniy. [Stanrard of RF. The electromagnetic compatibility of technical equipment. Stability to nanosecond impulse noise. Requirements and test methods]. Moscow, GOSSTANDART OF RUSSIA Publ., 1999. (In Russian)

2. Myrova LO, Chepizhenko A.Z. Obespechenie stoykosti apparatury svyazi k ioniziruyuschim i elektromagnitnym izlucheniyam.  [Provision of resistance of communication equipment to ionizing and electromagnetic radiation]. Moscow,  Radio i Svyaz Publ., 1988. (In Russian)

3. Rickets L.U., Bridges D.E., Mayletta D. Elektromagnitnyi impuls i metody ego zaschity. [Electromagnetic pulse and methods of protection]. Moscow, Atomizdat Publ., 1979. (In Russian)

4. Hodakov A.M., Sergeev V.A., Gavrikov A.A. Thermoelectric processes in a heterojunction light-emitting diode under the influence of powerful pulsed microwave radiation on it.  Zhurnal Radioelektroniki - Journal of Radioelectronics.  2017, No. 3. Available at http://jre.cplire.ru/jre/mar17/6/text.pdf. (In Russian)

5. Wunsh D.C., Bell R.R. Determination of threshold failure levels of semiconductor diodes and transistors due to pulse voltage.  IEEE Transaction on Nuclear Science. 1968, Vol. NS-15, No. 6, pp. 244-259.

6. Alexeev V.F., Juravlev V.I. Thermal models of failures of semiconductor structures under the influence of powerful electromagnetic pulses. Doklady BGUIR - Reports of BSUIR. 2005. No. 2. pp. 65-72. (In Russian)

7. Sergeev V.A., Hodakov A.M. Thermoelectric models of powerful bipolar semiconductor devices. Part II. Nonlinear heat-electric model of high-power light-emitting diodes. Journal of Communications Technology and Electronics, 2015, Vol. 60, No. 12, Ů. 1328-1332, DOI: 10.1134/S1064226915080161

8. Lee S., Song V.Au. Spreading Resistance Model for Electronic packaging.  Proceedings of ASME/JSME Thermal Engineering Conference. 1995. Vol. 4. p. 199.

9. Light-Emitting Diodes. Edited by Fred Schubert, Cambridge University Press, 2006.

 

For citation:

A. M. Hodakov, V. A. Sergeev. Evaluation of LED durability to the effect of a periodic sequence of microwave pulses in the framework of the thermoelectric model. Zhurnal Radioelektroniki - Journal of Radio Electronics. 2017. No. 10. Available at http://jre.cplire.ru/jre/oct17/7/text.pdf. (In Russian)