Local measurement of dielectric properties of materials by terahertz Josephson spectroscopy

A.    Snezhko^1,2, V. Pavlovskiy¹, V. Gubankov¹, V. Pokalyakin¹

¹Kotelnikov Institute of Radio-engineering and Electronics of RAS

²Moscow Institute of Physics and Technology

 

The paper is received on September 15, 2015

 

Abstract. In the paper a method based on Josephson spectroscopy for local measurement of real dielectric permittivity of different materials with low losses is demonstrated. Dielectric permittivities of r-cut sapphire ε_sapphire = 9.6 at f=155,2 GHz and (001) NdGaO₃ ε_NGO = 23 at f=106,4 GHz are obtained.

Key words: terahertz electronics, superconductivity, Josephson junction.