"JOURNAL OF RADIO ELECTRONICS"  N 7, 2010

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Accumulation model of the IC damages in electromagnetic fields of the RF pulses
 

A. V. Klyuchnik1, Yu. A. Pirogov2, A. V. Solodov1
 

1Moscow Radio Technical Institute of Russian Academy of Sciences

2Lomonosov Moscow State University, Centre of Magnetic Tomography and Spectroscopy

Received June 29, 2010

 

 

Abstract. In the present work the statistical model of defects accumulation under the pulse burst is presented. A statistical particularity of the IŃ damage in multi-pulse mode is explored.
 

Keywords: model, accumulation, damage, integrated circuits, RF pulse.