Simulation of flicker noise in bicristal Josephson junctions
V. N. Gubankov1, V.V. Pavlovskiy1, A.V.
Snezhko1,2
1Kotelnikov
Institute of Radio-engineering and Electronics of RAS
2Moscow
Institute of Physics and Technology
The paper is received on November 30, 2015
Abstract.
Calculations of Josephson junction (JJ) IV-curve and response on external
electromagnetic radiation in the presence of critical current and normal state
resistance 1/f fluctuations (flicker noise) were performed. The influence
of flicker-noise on JJ wide-band and selective detecting characteristics was
investigated and compared with the influence of thermal noise. It was shown a
qualitative coincidence of high-frequency JJ characteristics in the cases of
flicker noise and normal current thermal fluctuations. In the case of flicker
noise about 18% enhancement of classical detection frequency band is possible. A JJ oscillation
linewidth is about twice greater in the case of flicker noise than in the case
of thermal noise at the equal response amplitudes. The results obtained show a
possible significant influence of 1/f fluctuations on high-frequency JJ
characteristics.
Key words:
terahertz electronics, superconductivity, Josephson junction, flicker noise.