"JOURNAL OF RADIO ELECTRONICS" (Zhurnal Radioelektroniki ISSN 1684-1719, N 11, 2019

contents of issue      DOI  10.30898/1684-1719.2019.11.20    full text in Russian (pdf)  

UDC 537.86

Numerical modeling of the influence of electromagnetic pulses on the operation of typical electronic self-oscillating systems

 

P. S. Glazunov 1, E. A. Vorobyeva 1, V. A. Vdovin 2, A. I. Slepkov 1

1 Faculty of Physics, Lomonosov Moscow State University, Leninskie Gory, 1-2, Moscow 119991, Russia

2Kotelnikov Institute of Radio Engineering and Electronics of Russian Academy of Sciences, Mokhovaya,  11-7, Moscow, 125009, Russia

 

The paper is received on November 19, 2019

 

Abstract. The results of a theoretical study of the effect of short electromagnetic pulses on the stability of the operation of clock generators are presented. The Van der Pol oscillator is used as a mathematical model of a clock generator. The dependence of the probability of generator failure on the characteristics of impulse noise, such as amplitude and duration, is investigated. It is shown that the probability of bit failure as a function of the amplitude and duration of the interference under certain conditions depends on their product. It is shown that the probability of a bit failure is highly dependent on the point in time at which the impact occurs. In the general case, the dependence of the probability of a bit failure on the moment of the onset of pulse interference has two maxima. An explanation is proposed for the presence of these maxima based on the stability of the solution of the Van der Pol equation for different operating modes of the generator.

Keywords: exposure to electromagnetic pulses, clock generator, Van der Pol oscillator, probability of failure.

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For citation:

Glazunov P.S., Vorobyeva E.A., Vdovin V.A., Slepkov A.I. Numerical modeling of the influence of electromagnetic pulses on the operation of typical electronic self-oscillating systems. Zhurnal Radioelektroniki - Journal of Radio Electronics. 2019. No. 11. Available at http://jre.cplire.ru/jre/nov19/20/text.pdf

DOI  10.30898/1684-1719.2019.11.20