Kotelnikov Institute of Radio Engineering and Electronics of RAS Русский Sign in Submit a paper
Journal of Radio Electronics Online scientific journal · eISSN 1684-1719
2018, № 10 · RADIO ELECTRONICS RELATED PROBLEMS

Measurement of dielectric loss at millimeter range in the low loss materials with arbitrary ratio of wavelength and sample thickness

E.E. Chigryai1, B.M. Garin1, R.N. Denisyuk1

1 Fryazino Branch of Kotelnikov IRE RAS, Friazino, Russia
Full text (PDF) DOI: 10.30898/1684-1719.2018.10.10 EDN YOLABF

Abstract

For the first time the measurement technique is developed for dielectric loss in the low loss materials at the long-wave part of the millimeter range of electromagnetic waves on the basis of compact open semi-symmetric confocal resonator for the samples with arbitrary ratio of the sample thickness and wavelength in the dielectric material. The loss in the aluminum oxide ceramics (Al2O3) of the brand VK-99 was measured at room temperature at the frequency 69.4 GHz: tanδ = 3.1×10-4. This value is close to the corresponding value in the aluminium oxide ceramics Al2O3 of the Russian production of the brand VK100M, and it is lower than in the corresponding ceramics of the Chinese production [5]. In addition, this value is close to the loss in the single crystal of Al2O3 (sapphire). This indicates a very high quality of the modern Russian ceramics of aluminum oxide.

  • open resonator
  • millimeter range of electromagnetic waves
  • dielectric loss
  • Low loss materials
  • открытый резонатор
  • миллиметровый диапазон электромагнитных волн
  • диэлектрические потери
  • малопоглощающие материалы
Аннотация (на русском)

Измерение диэлектрических потерь в малопоглощающих материалах в миллиметровом диапазоне при произвольном соотношении длины волны и толщины образца

Впервые разработана методика измерения диэлектрических потерь в малопоглощающих материалах в длинноволновой части миллиметрового диапазона на основе компактного открытого полусимметричного конфокального резонатора для образцов при произвольном соотношении толщины образца и длины волны в диэлектрическом материале. Измерены потери в керамике оксида алюминия Al2O3 марки ВК-99 при комнатной температуре на частоте 69.4 ГГц: tanδ = 3.1×10-4. Это значение близко к соответствующей величине в керамике оксида алюминия Al2O3 отечественного производства марки ВК100М и ниже, чем в соответствующей керамике производства Китая. Кроме того, эти значения близки к потерям в монокристалле Al2O3 (сапфир). Это свидетельствует об очень высоком качестве современной российской керамики оксида алюминия.

For citation

Chigryai E.E., Garin B.M., Denisyuk R.N. Measurement of dielectric loss at millimeter range in the low loss materials with arbitrary ratio of wavelength and sample thickness // Journal of Radio Electronics. – 2018. – No. 10. https://doi.org/10.30898/1684-1719.2018.10.10

References

  1. Chigryai E.E., Khokhov G.I., and Nikitin I.P., Quasioptical beam splitters on thin dielectric films in the millimeter and submillimeter wave ranges. Zhurnal Radioelektroniki - Journal of Radio Electronics, 2016, No. 6. Available at http://jre.cplire.ru/jre/jun16/9/text.pdf. (In Russian)
  2. E.E. Chigryai, B.M. Garin, R.N. Denisyuk, D.S. Kalenov, I.P. Nikitin "Ultralow absorption in silicon carbide in the millimeter wave range", Zhurnal Radioelektroniki - Journal of Radio Electronics, 2016, No. 11. Available at http://jre.cplire.ru/jre/nov16/6/text.pdf.
  3. Firsenkov A.I., Kanivets A.Yu., Kasatkina T.S., Ershova O.M., Ivanova L.P., Ershova P.V., Microwave dielectric materials fabricated by Open Public Corporation "Plant Magneton", Sbornik trudov chetvertoi vserossiiskoi konferentsii "Elektronika i mikroelektronika SVCh" [Collected papers of the Fourth All-Russian Conf. "Microwave Electronics and Microelectronics"], St. Petersburg, LETI, 2015, Vol. 2, pp. 55-59. (In Russian)
  4. Parshin V.V., Serov E.A., and Ershova P.V., The study of dielectric properties of modern ceramic materials in the millimeter range, Sbornik Trudov Shestoi Vserossiiskoi Konferentsii "Elektronika i mikroelektronika SVCh" [Collected papers of the Sixth All-Russian Conf. "Microwave Electronics and Microelectronics"], St. Petersburg, LETI, 2017, pp. 418-422.
  5. Vladimir V. Parshin, Evgeny A. Serov, Evgeny E. Chigryai, Boris M. Garin, Roman N. Denisiuk, Dmitry S. Kalyonov, Mingqing Ding, Lili Li, Yanping Lu, Yanling Yang, Youhuan Liang, Jinjun Feng, and Polina V. Ershova, "Dielectric parameters of the modern low-loss ceramics in the microwave, millimeter, and submillimeter ranges", Zhurnal Radioelektroniki - Journal of Radio Electronics, 2018, No.2, Available at: http://jre.cplire.ru/jre/feb18/10/text.pdf
  6. Born M. and Wolf E., Principles of Optics, London: Pergamon Press, 1970, 4th ed.
  7. Dryagin Yu.A., Parshin V.V., A method for determination of dielectric permittivity and loss tangent. The Copyright Certificate No. 1539681, Bull. No. 40, The USSR State Committee for inventions and discoveries, January, 30, 1990. (In Rusian)
  8. Dryagin Yu.A., Parshin V.V. A method to measure dielectric parameters in 5÷0,5 mm wavelength band, Int. J. of Infrared and Millimeter Waves. 13 (1992) 1023-1032.
  9. S.N. Vlasov, E.V. Koposova, A.B. Mazur and V.V. Parshin. On permittivity measurement by a resonance method. Radiophysics and Quantum Electronics, 1996, Vol. 39, No. 5, pp. 410-415.
  10. Parshin V.V., Tretyakov M.Yu., Koshelev M.A., Serov E.A., Instrumental complex and the results of precise measurements of MM and SubMM wave propagation in condensed media and atmosphere. Radiophysics and Quantum Electronics, 2012, Vol. 52, No. 8, pp. 525-535.
  11. Parshin V.V., Tretyakov M.Yu., Koshelev M.A., Serov E.A., Modern resonator spectroscopy at submillimeter wavelengths. IEEE Sensors Journal, 2013, Vol. 13, No. 1, pp. 18-23.
  12. Parshin V.V., Serov E.A., Precision methods of research of dielectrics and metals in the range of 40-500 GHz and in the temperature range 4-900 K., Sbornik Trudov Chetvertoi Vserossiiskoi Konferentsii "Elektronika i mikroelektronika SVCh" [Collected papers of the Forth All-Russian Conf. "Microwave Electronics and Microelectronics"], St. Petersburg, LETI, 2015, pp. 34-39., ISBN 978-5-76-29-1634-9. (In Russian)