Èíñòèòóò ðàäèîòåõíèêè è ýëåêòðîíèêè èì. Â. À. Êîòåëüíèêîâà
Ðîññèéñêîé àêàäåìèè íàóê

ÆÓÐÍÀË ÐÀÄÈÎÝËÅÊÒÐÎÍÈÊÈ

ýëåêòðîííûé æóðíàë, ISSN 1684-1719

Ãëàâíûé ðåäàêòîð àêàäåìèê Þ.Â. ÃÓËßÅÂ

ÎÃËÀÂËÅÍÈß ÂÛÏÓÑÊÎÂ | Î ÆÓÐÍÀËÅ | ÐÅÄÊÎËËÅÃÈß | ÐÅÖÅÍÇÈÐÎÂÀÍÈÅ | ÈÇÄÀÒÅËÜÑÊÀß ÝÒÈÊÀ | ÈÍÔÎÐÌÀÖÈß ÄËß ÀÂÒÎÐÎÂ | ÊÎÍÒÀÊÒÍÀß ÈÍÔÎÐÌÀÖÈß | ÏÎÈÑÊ

N 2 - ôåâðàëü 2008 ã.

Àëãîðèòì ïîëó÷åíèÿ êîðîòêèõ ñôåðè÷åñêèõ êîäîâ íà îñíîâå òðîåê Øòåéíåðà.
À.Ñ. ×åðíûøåâ
Àííîòàöèÿ.   Òåêñò: html, pdf (137 kB)

Determination of technological parameters of drift transistors according to specified operational characteristics.
A.N. Frolov, Ê.A. Frolov, S.V. Shutov
Àííîòàöèÿ.   Òåêñò: html, pdf (67 kB)

  Àïïðîêñèìàöèîííûé ñèíòåç àíòåííîé ðåøåòêè àâòîêîìïåíñàòîðà ïîìåõ.
Â.Í. Êîëåñíèêîâ, Ñ.Å. Ìèùåíêî, Â.Â. Øàöêèé
Àííîòàöèÿ.   Òåêñò: html, pdf (530 kB)

Influence of light scattering by 3D-irregularities on the characteristics of the integrated optical devices using for optical signal processing.
A.A. Egorov

Àííîòàöèÿ.   Òåêñò: html, pdf (93 kB)

- ñòàòüÿ íà ðóññêîì ÿçûêå, - ñòàòüÿ íà àíãëèéñêîì ÿçûêå.


ÎÃËÀÂËÅÍÈß ÂÛÏÓÑÊÎÂ | Î ÆÓÐÍÀËÅ | ÐÅÄÊÎËËÅÃÈß | ÐÅÖÅÍÇÈÐÎÂÀÍÈÅ | ÈÇÄÀÒÅËÜÑÊÀß ÝÒÈÊÀ | ÈÍÔÎÐÌÀÖÈß ÄËß ÀÂÒÎÐÎÂ | ÊÎÍÒÀÊÒÍÀß ÈÍÔÎÐÌÀÖÈß | ÏÎÈÑÊ