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, ISSN 1684-1719

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N 2 - 2008 .

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Determination of technological parameters of drift transistors according to specified operational characteristics.
A.N. Frolov, .A. Frolov, S.V. Shutov
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Influence of light scattering by 3D-irregularities on the characteristics of the integrated optical devices using for optical signal processing.
A.A. Egorov

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