Kotelnikov Institute of Radioengineering and Electronics of Russian Academy of Sciences

JOURNAL OF RADIO ELECTRONICS

(zhurnal radioelektroniki)

online journal, eISSN 1684-1719

Editor-in-chief academician Yu.V. Gulyaev

CONTENTS | ABOUT THE JOURNAL |  EDITORIAL BOARD | PEER REVIEW | Publication Ethics | INFORMATION FOR AUTHORSCONTACTS | SEARCH

N 9 - September 2010

We warmly congratulate our editor-in-chief, Yuri V. Gulyaev, on the 75 anniversary!

 

Multi-conductor quadrifilar antennas.
S. E. Bankov, A. S. Bychkov, A. G. Davydov, A. A. Kurushin
Abstract.   Full text:   html,   pdf
(1 078 kB)

Analysis of the propagation, transformation and scattering of the monochromatic electromagnetic waves in the irregular waveguides: a case of integrated-optical waveguide with statistic surface roughness and a case of optical nanofibers with random rough surface.
A.A. Egorov, A.V. Stavtsev, T.K. Chekhlova, A.G. Timakin, V.I. Grygoruk, Yu.A. Gayday, A.V. Kovalenko, V.N. Kurashov
Abstract.   Full text:   html,   pdf (363 kB)

  • BIOMEDICAL RADIO ELECTRONICS

  • MATHEMATICAL MODELS IN RADIO ELECTRONICS PROBLEMS

  • NONLINEAR WAVE DYNAMICS IN RADIO ELECTRONICS

  • COMPUTER SCIENCE AND TELECOMMUNICATIONS

Realization of artificial neural networks on the multinuclear processor SEAforth.
A. S. Anisimov
, A.V. Kalachev
Abstract.   Full text:   html,   pdf (372 kB)

Presentation of the models of signals in the system identifiers.
A. A. Gorshenkov, Y. N. Klikushin
Abstract.   Full text:   html,   pdf (526 kB)

Influence of noise immunity of broadband wireless access systems on the quality indices of streaming video.
O. I. Sheluhin, U. A. Ivanov

Abstract.   Full text:   html,   pdf (1 392 kB)

Analysis of sensitivity of an integrated-optical sensor of gaseous substances in the presence of an additive statistic noise.
A. A. Egorov, T. K. Chekhlova, V. I .Grygoruk, A. V. Kovalenko
Abstract.   Full text:   html,   pdf (315 kB)

- article in Russian, - article in English.


CONTENTS | ABOUT THE JOURNAL |  EDITORIAL BOARD | PEER REVIEW | Publication Ethics | INFORMATION FOR AUTHORSCONTACTS | SEARCH